High temperature FTIR data

The statistical data in this document are all from the actual measurements of the members of the group, involving materials such as Al2O3, Ge, Nb, SiC, and a layer of TiN with a thickness of 200nm deposited on the flat silicon wafer

Examples of folder naming methods
Al2O3_T_400C-1200C_Emissivity
Represents the high temperature emissivity of alumina in the temperature range of 400 degrees Celsius to 1200 degrees Celsius

SiC_T_800K-1173K_Emissivity
Represents the high temperature emissivity of the SiC material in the temperature range of 800 Kelvin to 1173 Kelvin

Please note that some materials are tested in degrees Celsius and others in Kelvin, please note the distinction

If the subsequent measurement of the high temperature emissivity of the new material will also be updated here

Like the folder Nb, there are Nb400C, Nb400C (2), Nb400C (3) such named data, that is, to make multiple measurements at this temperature

The first column in the CSV format is the wave number, the unit is cm^-1, and the range is from 400cm^-1-4000cm^-1, which needs to be converted into the wavelength, that is, 10,000/400cm ^-1=25um, 10,000/4000cm ^-1=2.5um. Therefore, the wavelength range is 2.5um-25um, and the second column is the actual measured emissivity, in %

Note that each time the high temperature emissivity measurement is performed, the blackbody background measurement has been carried out in advance, and the influence caused by the blackbody background emissivity has been deducted

The test equipment parameters are as follows:
FT-IR (Nicolet iS50)
Spectral Range: 12,000-350 cm^-1
Spectral Resolution better than 0.09cm^-1
Wavenumber Precise better than 0.005 cm^-1
Peak-Peak Noise better than 60,000:1(1min scan, 4cm^-1); better than 13,000:1 (5 second scan, 4cm^-1)